Customers & Technology Support

Persons in charge and contact information

Test and analysis of semiconductor
Jeong Hancheol
Lee Jinsu
ESD/EOS/EMI Test (Gwanggyo open Lab.)
Kim Dongseong
Failure analysis (Gwanggyo Open Lab.)
Woo Jaehyeong
Property/ chemical analysis (Gwanggyo open Lab.)
Lee Soojeong
QRT China
Han Sujin
Test and analysis of automotive application component
Shim Youngryul
Lee Kyoungtae
Vibration/Mechanical test
Jung Seokhwan
FIB (Gwanggyo open Lab.)
Yeo Jeonghan
Sanga Kim
Lee Sang