Document Number |
Content |
JESD22-A100 |
Cycled Temperature-Humidity-Bias Life Test |
JESD22-A101 |
Steady State Temperature Humidity Bias Life Test |
JESD22-A102 |
Accelerated Moisture Resistance - Unbiased Autoclave |
JESD22-A103 |
High Temperature Storage Life |
JESD22-A104 |
Temperature Cycling |
JESD22-A105 |
Power and Temperature Cycling |
JESD22-A106 |
Thermal Shock |
JESD22-A107 |
Salt Atmosphere |
JESD22-A108 |
Temperature, Bias, and Operating Life |
JESD22-A110 |
Highly-Accelerated Temperature and Humidity Stress Test (HAST) |
JESD22-A113 |
Preconditioning of Nonhermetic Surface Mount Devices prior to Reliability Testing |
JESD22-A115 |
Electrostatic Discharge (ESD) Sensitivity Testing Machine Model (MM) |
JESD22-A117 |
ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST |
JESD22-A118 |
Accelerated Moisture Resistance -Unbiased HAST |
JESD22-A119 |
Low Temperature Storage Life |
JESD22-B101 |
External Visual |
JESD22-B102 |
Solderability |
JESD22-B103 |
Vibration, Variable Frequency |
JESD22-B106 |
Resistance to Solder Shock for Through-Hole Mounted Devices |
JESD22-B110 |
Mechanical Shock - Compont and Subassembly |
JESD22-B111 |
Board Level Drop Test Method of Components for Handheld Electronic Products |
JESD22-B113 |
Board Level Cyclic Bend Test Method for Interconnect Reliability Characterization of Components for Handheld Electronic Products |
IPC/JEDEC J-STD-002 |
Solderability Test for Component Leads, Terminations, Lugs, Terminals and Wires |
IPC/JEDEC J-STD-020 |
Moisture/Reflow Sensitivity Classification for Nonhermetic Solid State Surface Mount Devices |
ANSI/ESDA/JEDEC JS-001 |
Human Body Model (HBM) - Component Level |
ANSI/ESDA/JEDEC JS-002 |
Charged Device Model (CDM) – Device Level |
JEP122 |
Failure Mechanisms and Models for Semiconductor Devices |
JESD47 |
Stress-Test-Driven Qualification of Integrated Circuits |
JESD74 |
Early Life Failure Rate Calculation Procedure for Semiconductor Components |
JESD78 |
IC Latch-Up Test |
JESD226 |
RF BIASED LIFE (RFBL) TEST METHOD |