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System Configuration

Dynamic Acceleration System

• 40CH, 19" Rack Mount (31U)
• RF Generation Units: 5ea
• RF Detection Unit: 1ea
• Power Supply Unit: 1ea
• Cabinet Power: 220 Vac, 30 A, 50/60 Hz
• Cabinet Dimension: 600(W)ⅹ900(D)ⅹ1650(H) mm
• Cabinet Weight: 220 kg
• Operating Ambient Temperature: +10~+40 °C
• Test Environment: Standard Laboratory

RF Generation Unit (5 Units)

• 8CH, 19" Rack Mount (3U)
• RF Frequency Range:
  ub-6 0.6~6.0 GHz, mmWave 27~32 GHz
• RF Output Power: Up to +33 dBm
• Dynamic Range: 25 dB
• RF Harmonic: ≤-25 dBc
• RF Mode: CW-mode, Pulsed-mode (Optional)

RF Detection Unit (1 Unit)

• 40CH, 19" Rack Mount (3U)
• RF Input Level: Up to +43 dBm
• Dynamic Range: 30 dB
• Detection Accuracy: ±0.3 dB

Power Supply Unit

• Supply Power: 220 Vac, 30 A, 50/60 Hz
• Peak Power: 6 kW

Static Acceleration System

• 40CH, 19" Rack Mount (31U)
• Static Acceleration Units: 5ea
• Smart Test Fixture: 40 Samples
• Cabinet Power Supply: 220 Vac, 30 A, 50/60 Hz
• Cabinet Dimension: 600(W)ⅹ900(D)ⅹ1650(H) mm
• Cabinet Weight: 180 kg
• Operating Ambient Temperature: +10~+40 °C
• Test Environment: Standard Laboratory

Static Acceleration Unit (5 Units)

• 8CH, 19" Rack Mount (4U)
• Temperature Stress: Up to +200 °C
• Thermocouple per DUT
• Current Monitoring: Up to 2.0 A
• 5CH-bias Supply per DUT
  : Bias 1 (3CH): Up to +28 V @ 1.0 A
  : Bias 2 (1CH): Up to +50 V @ 2.0 A
  : Bias 3 (1CH): -10 V @ 0.1 A
• Supply Power per DUT: Up to 100 W

Smart Test Fixture

• Customized for Devices
• Embedded Heater
• Supply Power: 220 V AC Input for Heater
• RF Power: Up to 125 W RF CW Output Power.
• DC Power: Up to 400 W at 5 DC Bias Connections.
• Dimension: 120(W)ⅹ115(D)ⅹ64(H) mm
• Weight: 1 kg (2.2 lb) or less

Operating Software

• Acceleration Conditions Control per DUT:
  RF, Temperature, Voltage
• Real Time Monitoring:
  RF-Input & Output, Temperature, Voltage, Current
• RF Auto Calibration set-up

Lifetime Estimation Software

• Visualization of Degradation
• Automatic Calculation of Failure Time per DUT
• Probability Distribution Analysis of Reliability Data:
  Log-normal, Weibull, Exponential, etc.
• Analysis of Accelerated Lifetime Test:
  Activation Energy, Acceleration Factor, Estimate Lifetime at Use condition